Dr. Timothy J. Montalbano is a senior staff scientist specializing in x-ray diffraction and electron microscopy techniques. He performs Rietveld refinement on x-ray diffraction patterns to estimate nanoscale grain sizes and residual strain. For electron microscopy, he uses electron backscattered diffraction to perform orientation mapping and specialized Schmid factor analysis. Dr. Montalbano works on projects involving reactive additive manufacturing, hypersonic coatings, and metal matrix composites. He is also the point of contact for an optical particle sizer that can measure fibers or particles ranging from a few micrometers to a few millimeters. His areas of expertise include materials characterization, microscopy, and crystallography.
Ph.D., Materials Science and Engineering
University of California, Irvine
M.S., Mechanical Engineering
B.S., Mechanical Engineering