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Global Engagement at APL

Global Engagement at APL: An Introduction
William A. LaPlante Jr.

The Origin and History of the Global Engagement Department
Joseph C. Schissler and John P. Gibson

Guidance and Navigation in the Global Engagement Department
Frederick W. Riedel, Shannon M. Hall, Jeffrey D. Barton, James P. Christ, Brian K. Funk, Thomas D. Milnes, Peter E. Neperud, and David R. Stark

Miniature Analog GPS Translator for Trident Reentry Body Accuracy Analysis
Michael H. Boehme

Collecting Reentry Body GPS Translator Data Near Impact Using the Over-the-Horizon Buoy
Carlyn H. Weaver

Six-Degree-of-Freedom Digital Simulations for Missile Guidance, Navigation, and Control and Validation Test with USS Florida
Gregory M. Horstkamp, Jerome R. Vetter, Charles J. McSoley, and Ward J. Szerlag

A Concept for Command and Control
Robert R. Leonhard, Thomas H. Buchanan, James L. Hillman, John M. Nolen, and Timothy J. Galpin

Command and Control
Peter M. Trask, Frederic T. Case, Steven L. Forsythe, Thomas M. McNamara Jr., Paul D. North, Kim E. Richeson, Christine O. Salamacha, and John J. Tamer

Enhancing Systems Engineering Agility with Modeling and Simulation
Timothy M. Frey and Matthew C. Valencia


Inside Front Cover Editorial Information

Inside Back Cover Illustration

The Cover: The Global Engagement Department performs work throughout all phases of a concept known as a “kill chain,” a sequential and orderly process to successfully engage and deliver the desired effects on a target (in other words, not necessarily to destroy a target). To deliver effects anywhere on the globe, the U.S. military must be able to detect and track targets, coordinate their activities via command and control systems, engage the targets in the manner expected, and then assess the results of their actions. This issue of the Johns Hopkins APL Technical Digest shares the achievements of the Global Engagement Department over the broad range of activities encompassed by the kill chain.

Printable high-resolution version of cover in Acrobat PDF format.

© 2010 by The Johns Hopkins University Applied Physics Laboratory

The electronic version of the Johns Hopkins APL Technical Digest
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