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Tech Digest Vol.13 Num.2 Cover

Statistical Modeling at APL
Volume 13, Number 2 (April–June 1992)

Guest Editor's Introduction

J. C. Spall

Using Conditional Entropy to Evaluate a Correlator/Tracker

F. C. Deal, Jr.

Using Statistics to Assess the Performance of Neural Network Classifiers

L. V. Hutton

Large-Scale System Performance Prediction with Confidence from Limited Field Testing Using Parameter Identification

L. J. Levy, D. W. Porter

Isolating Errors in State-Space Models of Complex Systems

J. L. Maryak, M. S. Asher

Statistical Process Control for Total Quality

S. W. Ali

The Number of Tests Needed to Detect an Increase in the Proportion of Defective Devices

J. K. Telford


Scanning Tunneling Microscopy of Organic Conductors and Superconductors

R. Fainchtein


Statistical Aspects of Turbulence and Microstructure in the Ocean

M. A. Baker, S. A. Mack, and H. C. Schoeberlein


Writing and Research and Development Awards

L. L. Maier

Publications, Presentations, and Colloquia

APL Celebrates 80 Years of

Game-Changing Impact

Read more

80th anniversary