Technologies


Surface Structure Measurement Device

Reference#: P01827


Current means of assessing surface roughness at the 5 micrometer scale size and at surface roughnesses of a few micrometers consist of stylus probes or optical scatterometers. Such devices are not practical for measurement of tooth surface structure in vivo.

The Johns Hopkins Applied Physics Laboratory researchers have developed a concept that provides a convenient means of assessing surface roughness of teeth. The JHU/APL technology provides an optical measurement of tooth surface morphology using an optical probe--a small device that can be brought into contact with the tooth in order to make the measurements of the tooth. The resulting measurement is produced at the desired resolution without consideration of the optical properties of the tooth.

*JHU/APL is seeking development partners and licensees for this technology.

CONTACT:
Dr. G. R. Jacobovitz
Phone: (443) 778-9899
ott-techmanager3@jhuapl.edu


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